• 1 Micron Large Travel 50X Wafer Inspection Microscope
  • 1 Micron Large Travel 50X Wafer Inspection Microscope

    1 Micron Large Travel 50X Wafer Inspection Microscope

    Product Details:

    Place of Origin: china
    Brand Name: MICRO ACCURACY
    Certification: CE ISO SGS
    Model Number: SPC500

    Payment & Shipping Terms:

    Minimum Order Quantity: 1 Piece
    Price: negotiation
    Packaging Details: Standard exporting package
    Payment Terms: L/C, T/T, Western Union, MoneyGram
    Supply Ability: 50, 000PCS/Year
    Get Best Price Contact Now

    Detail Information

    Travel-X.Y Axis: 500*400(mm) Travel-Z Axis: 200mm
    Z-Axis Working Range: 108mm XY Feed Mechanism: Manual
    Z Feed Mechanism: CNC Resolution: 1 Micron
    X,Y-Axis Accuracy(µm): 2.5+L/200 Um, L=measuring Length (mm) Repeatability: 0.003mm
    Origin: Dongguan HS Code: 9031809090
    Port: Shenzhen, China
    High Light:

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    Product Description

    1 Micron Large Travel 50X Wafer Inspection Microscope

    Wafer Inspecting Microscope Inspect500


    INSPECT series measuring metallurgical microscope are widely used in semiconductor packages, solder pads, loop height, FPD panels (LCM), wafer level CSPS and so on.


    Features & Advantages of Wafer Inspecting microscope

    ■ High-precision marble base, table and column to ensure high stability and rigidity

    ■ Marble table design, with precision V-shaped cross rail, ensure long-term use without deform, effectively guarantee high mechanical precision

    ■ High-quality optical system and high-resolution CCD ensure sharp image edges

    ■ Three-ring and eight-zone LED ring surface cold light source and contour light source, avoid the deformation of precision parts caused by the heat from light

    ■ Optional Nikon tilting trinocular tube + quintuple nosepiece

    ■ Independent research and development of image measuring software, powerful and easy to operate


    Technical data

    X,Y axis travel(mm) 300*200 400*300 500*400
    Stage glass size(mm) 357*257 457*357 557*457
    Z axis travel(mm) 100
    X,Y,Z axis resolution (μm) 1
    Length unit Linear scale
    Measuring accuracy (μm) 2.5+L/150 L=measuring length (mm)
    Operation mode(X, Y) Manual
    Operation mode(Z) CNC
    Image system High resolution CCD camera
    Quintuple nosepiece 5X 10X 20X 50X
    Eyepiece WF10X
    Measuring software 2D measuring software
    Illumination Transmitted Epi-illumination system
    Contour LED parallel contour light
    Power supply AC100~240V 50/60Hz

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